Generic Processes & Materials - Workplan 2020

Version 1.0
 
  • Materials:
    • addition of new materials to the list of UV transparent
      • for very low-energy photoelectric-effect
    • add/update interfaces allowing use NIST parameters for custom element/materials 
  • Geometry Biasing with Importance:
    • Comparison between generic and importance biasing
    • Investigate rare crashes in Geometry-based Importance biasing
    • Implement extension for multiple particle-type biasing. 
  • Differential Cross-section class:
    • Design and implementation of at least an elastic diff. cross-section class to be used in DXTRAN option
    • Make use of this class in some processes
      • In particular the hadron elastic one
  • Generic Biasing:
    • Continue enriching event biasing options:​
      • DXTRAN-like biasing
      • Implicit capture
      • Occurrence biasing of charged particles, with cross-section changing over the step
    • Extend generic biasing scheme for at rest case
    • Statistical test suite to verify correctness of biasing wrt to analog
    • Feasibility studies and prototyping​
      • Investigate use of occurrence biasing to allow continuous density change inside a same volume
        • point-like interactions solved at principle level
        • what about continuous ?
      • Material/isotope biasing
      • Woodcock tracking
    • Large cross-section change (eg : neutrino interaction)
  • Fast Simulation:
    • Continuation of GFlash models revision
    • Modernisation of EM shower parametrisation
      • including automated tuning procedures
    • Investigate possibility of facilitators for machine learning inference
  • Radiotherapy & radioprotection:
    • Completion of the ambient dose equivalent H*(10) topics